Product overview
- Product number
- SN74BCT8240ADWRE4
- Manufacturer
- Texas Instruments
- Catalog
- Logic - Specialty Logic
- product description
- IC SCAN TEST DEVICE BUFF 24-SOIC
Documents and media
- Datasheets
- SN74BCT8240ADWRE4
Product Details
- Logic Type :
- Scan Test Device with Inverting Buffers
- Mounting Type :
- Surface Mount
- Number of Bits :
- 8
- Operating Temperature :
- 0°C ~ 70°C
- Part Status :
- Obsolete
- Supplier Device Package :
- 24-SOIC
- Supply Voltage :
- 4.5V ~ 5.5V
product description
IC SCAN TEST DEVICE BUFF 24-SOIC
Purchases and prices
Recommended Products
You may be looking for
XTEHVW-Q2-0000-00000H6FA
SG-8002CA 40.0000M-PHCL2
1808-832-B
TJA1028T/3V3/10,11
M1725-A-3506-B
MX3SWT-A1-R250-000AAA
M2057-B-3506-S
ABDFVCTCXO-12.800MHZ-E-2-T2
2344-632-AL
MAX3243ECAI+TG1Z
L1Q0-4070000001400
SIT8209AC-G2-18E-200.000000T
MAX4361ESA-T
MX6SWT-A1-R250-000CF7
LA1654FN-TLM-E
ABDFTCXO-50.000MHZ-E-2-CT
XTEHVW-Q2-0000-00000LAE9
SG-8002CA 48.0000M-PHCL2
7917-B-832-SS
TJA1028T/3V3/20:11
